Applied logistic regression/

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Bibliographic Details
Main Author: Hosmer, David W
Other Authors: Lemeshow, Stanley
Format: Book
Language:English
Published: New York: John Wiley, c1989.
Series:(Wiley series in probability and mathematical statistics)
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245 |a Applied logistic regression/  |c David W. Hosmer, Stanley Lemeshow. --  
260 |a New York:   |b John Wiley,  |c  c1989. 
300 |a xiii, 307p.: ill. ;   |c 24cm. 
490 |a (Wiley series in probability and mathematical statistics) 
500 |a "A Wiley-Interscience Publication". 
504 |a Bibliography: p. 291-300. Includes index and tables. 
650 |a Regression analysis   |9 106004 
700 |a Lemeshow, Stanley   |9 106005 
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