Applied logistic regression/

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Kaituhi matua: Hosmer, David W
Ētahi atu kaituhi: Lemeshow, Stanley
Hōputu: Pukapuka
Reo:Ingarihi
I whakaputaina: New York: John Wiley, c1989.
Rangatū:(Wiley series in probability and mathematical statistics)
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UL

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Tau karanga: 519.536 H827a
Tārua c1989. Not For Loan
Tārua c1989. On Shelf