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Fundamentals of Modern VLSI Devices / Yuan Taur & Tak H.Ning

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Detalhes bibliográficos
Autor principal:	Taur, Yuan
Outros Autores:	By, Ning, Tak H.
Formato:	Livro
Idioma:	inglês
Publicado em:	New Delhi : Cambridge, C2020.
Edição:	2nd ed.
Assuntos:	Integrated circuits very large scale integration Metal Oxide Semiconductors Complementary
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