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Fundamentals of Modern VLSI Devices / Yuan Taur & Tak H.Ning

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Detalles Bibliográficos
Autor Principal:	Taur, Yuan
Outros autores:	By, Ning, Tak H.
Formato:	Libro
Idioma:	inglés
Publicado:	New Delhi : Cambridge, C2020.
Edición:	2nd ed.
Subjects:	Integrated circuits very large scale integration Metal Oxide Semiconductors Complementary
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