Thin Films Processes and Characterization Techniques /

The book provides research scientists and engineers in industry information and data on the materials processing, characterization, and determination of materials’ physical-chemical properties. The book highlights optical and chemical properties obtained on novel materials using a range of depositio...

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Xehetasun bibliografikoak
Egile nagusia:	Nedelcu, Nicoleta (Egilea)
Erakunde egilea:	SpringerLink (Online service)
Formatua:	Baliabide elektronikoa eBook
Hizkuntza:	ingelesa
Argitaratua:	Cham : Springer International Publishing : Imprint: Springer, 2023.
Edizioa:	1st ed. 2023.
Gaiak:	Surfaces (Technology). Thin films. Materials > Analysis. Production engineering. Materials. Surfaces, Interfaces and Thin Film. Materials Characterization Technique. Process Engineering. Materials Engineering. Materials for Devices.
Sarrera elektronikoa:	https://doi.org/10.1007/978-3-031-06616-0
Etiketak:	Etiketa erantsi Etiketarik gabe, Izan zaitez lehena erregistro honi etiketa jartzen!

Aurkibidea:

Chapter 1. Introduction
Chapter 2. Thin layer method
Chapter 3. Vacuum thin film deposition installation
Chapter 4. Method for characterizing thin layer
Chapter 5. Study of optical and chemical properties.

Thin Films Processes and Characterization Techniques /

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