Lifetime Reliability-aware Design of Integrated Circuits
This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest resea...
সংরক্ষণ করুন:
| প্রধান লেখক: | , |
|---|---|
| সংস্থা লেখক: | |
| বিন্যাস: | বৈদ্যুতিক বৈদ্যুতিন গ্রন্থ |
| ভাষা: | ইংরেজি |
| প্রকাশিত: |
Cham :
Springer International Publishing : Imprint: Springer,
2023.
|
| সংস্করন: | 1st ed. 2023. |
| বিষয়গুলি: | |
| অনলাইন ব্যবহার করুন: | https://doi.org/10.1007/978-3-031-15345-7 |
| ট্যাগগুলো: |
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| 100 | 1 | |a Raji, Mohsen. |e author. |0 (orcid)0000-0001-7113-5197 |1 https://orcid.org/0000-0001-7113-5197 |4 aut |4 http://id.loc.gov/vocabulary/relators/aut | |
| 245 | 1 | 0 | |a Lifetime Reliability-aware Design of Integrated Circuits |h [electronic resource] / |c by Mohsen Raji, Behnam Ghavami. |
| 250 | |a 1st ed. 2023. | ||
| 264 | 1 | |a Cham : |b Springer International Publishing : |b Imprint: Springer, |c 2023. | |
| 300 | |a 1 online resource (XIII, 107 p. 31 illus.). |b 13 illus. in color. | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
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| 341 | 0 | |b Table of contents navigation |2 onix | |
| 341 | 0 | |b Single logical reading order |2 onix | |
| 341 | 0 | |b Short alternative textual descriptions |2 onix | |
| 341 | 0 | |b Use of color is not sole means of conveying information |2 onix | |
| 341 | 0 | |b Use of high contrast between text and background color |2 onix | |
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| 341 | 0 | |b All non-decorative content supports reading without sight |2 onix | |
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| 505 | 0 | |a 1. Impacts of Process Variations and Aging on Lifetime Reliability of Flip-Flops -- 2 Restructuring-based Lifetime Reliability Improvement of Nano-scale Master-Slave Flip-Flops -- 3 Lifetime Reliability Improvement of Pulsed Flip-Flops -- 4 Gate Sizing-based Lifetime Reliability Improvement of Integrated Circuits -- 5 Joint Timing Yield and Lifetime Reliability Optimization of Integrated Circuits -- 6 Lifetime Reliability Optimization Algorithms of Integrated Circuits using Dual Threshold Voltage Assignment. | |
| 520 | |a This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits. Provides an easy-to-follow procedure for analyzing lifetime reliability of nano-scale digital circuits; Describes state-of-the artaging- and process variation-aware CAD algorithms; Includes reliability improvement techniques for common clocked storage element. | ||
| 532 | 8 | |a Accessibility summary: This PDF does not fully comply with PDF/UA standards, but does feature limited screen reader support, described non-text content (images, graphs), bookmarks for easy navigation and searchable, selectable text. Users of assistive technologies may experience difficulty navigating or interpreting content in this document. We recognize the importance of accessibility, and we welcome queries about accessibility for any of our products. If you have a question or an access need, please get in touch with us at accessibilitysupport@springernature.com. | |
| 532 | 8 | |a No reading system accessibility options actively disabled | |
| 532 | 8 | |a Publisher contact for further accessibility information: accessibilitysupport@springernature.com | |
| 588 | |a Print version record. | ||
| 650 | 0 | |a Electronic circuits. | |
| 650 | 0 | |a Embedded computer systems. | |
| 650 | 0 | |a Electronic circuit design. | |
| 650 | 1 | 4 | |a Electronic Circuits and Systems. |
| 650 | 2 | 4 | |a Embedded Systems. |
| 650 | 2 | 4 | |a Electronics Design and Verification. |
| 700 | 1 | |a Ghavami, Behnam. |e author. |4 aut |4 http://id.loc.gov/vocabulary/relators/aut | |
| 710 | 2 | |a SpringerLink (Online service) | |
| 773 | 0 | |t Springer Nature eBook | |
| 776 | 0 | 8 | |i Printed edition: |z 9783031153440 |
| 776 | 0 | 8 | |i Printed edition: |z 9783031153464 |
| 776 | 0 | 8 | |i Printed edition: |z 9783031153471 |
| 856 | 4 | 0 | |u https://doi.org/10.1007/978-3-031-15345-7 |
| 912 | |a ZDB-2-ENG | ||
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| 950 | |a Engineering (SpringerNature-11647) | ||
| 950 | |a Engineering (R0) (SpringerNature-43712) | ||