SpringerLink (Online service), Girard, P., Blanton, S., & Wang, L. (2023). Machine Learning Support for Fault Diagnosis of System-on-Chip (1st ed. 2023.). Springer International Publishing : Imprint: Springer. https://doi.org/10.1007/978-3-031-19639-3
Cita Chicago (17th ed.)SpringerLink (Online service), Patrick Girard, Shawn Blanton, i Li-C Wang. Machine Learning Support for Fault Diagnosis of System-on-Chip. 1st ed. 2023. Cham: Springer International Publishing : Imprint: Springer, 2023. https://doi.org/10.1007/978-3-031-19639-3.
Cita MLA (9th ed.)SpringerLink (Online service), et al. Machine Learning Support for Fault Diagnosis of System-on-Chip. 1st ed. 2023. Springer International Publishing : Imprint: Springer, 2023. https://doi.org/10.1007/978-3-031-19639-3.