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Machine Learning Support for Fault Diagnosis of System-on-Chip

This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer retu...

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Dades bibliogràfiques
Autor corporatiu:	SpringerLink (Online service)
Altres autors:	Girard, Patrick (Editor), Blanton, Shawn (Editor), Wang, Li-C (Editor)
Format:	Electrònic eBook
Idioma:	anglès
Publicat:	Cham : Springer International Publishing : Imprint: Springer, 2023.
Edició:	1st ed. 2023.
Matèries:	Electronic circuits. Electronic circuit design. Microprocessors. Computer architecture. Electronic Circuits and Systems. Electronics Design and Verification. Processor Architectures.
Accés en línia:	https://doi.org/10.1007/978-3-031-19639-3
Etiquetes:	Afegir etiqueta Sense etiquetes, Sigues el primer a etiquetar aquest registre!

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