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Machine Learning Support for Fault Diagnosis of System-on-Chip

This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer retu...

Deskribapen osoa

Gorde:
Xehetasun bibliografikoak
Erakunde egilea: SpringerLink (Online service)
Beste egile batzuk: Girard, Patrick (Argitaratzailea), Blanton, Shawn (Argitaratzailea), Wang, Li-C (Argitaratzailea)
Formatua: Baliabide elektronikoa eBook
Hizkuntza:ingelesa
Argitaratua: Cham : Springer International Publishing : Imprint: Springer, 2023.
Edizioa:1st ed. 2023.
Gaiak:
Electronic circuits.
Electronic circuit design.
Microprocessors.
Computer architecture.
Electronic Circuits and Systems.
Electronics Design and Verification.
Processor Architectures.
Sarrera elektronikoa:https://doi.org/10.1007/978-3-031-19639-3
Etiketak: Etiketa erantsi
Etiketarik gabe, Izan zaitez lehena erregistro honi etiketa jartzen!
Aurkibidea:
  • Introduction
  • Prerequisites on Fault Diagnosis
  • Conventional Methods for Fault Diagnosis
  • Machine Learning and Its Applications in Test
  • Machine Learning Support for Logic Diagnosis
  • Machine Learning Support for Cell-Aware Diagnosis
  • Machine Learning Support for Volume Diagnosis
  • Machine Learning Support for Diagnosis of Analog Circuits
  • Machine Learning Support for Board-level Functional Fault Diagnosis
  • Machine Learning Support for Wafer-level Failure Cluster Identification
  • Conclusion.

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