Machine Learning Support for Fault Diagnosis of System-on-Chip

This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer retu...

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Dettagli Bibliografici

Ente Autore:	SpringerLink (Online service)
Altri autori:	Girard, Patrick (Redattore), Blanton, Shawn (Redattore), Wang, Li-C (Redattore)
Natura:	Elettronico eBook
Lingua:	inglese
Pubblicazione:	Cham : Springer International Publishing : Imprint: Springer, 2023.
Edizione:	1st ed. 2023.
Soggetti:	Electronic circuits. Electronic circuit design. Microprocessors. Computer architecture. Electronic Circuits and Systems. Electronics Design and Verification. Processor Architectures.
Accesso online:	https://doi.org/10.1007/978-3-031-19639-3
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