High-Z Materials for X-ray Detection Material Properties and Characterization Techniques /
This book will provide readers with a good overview of some of most recent advances in the field of High-Z materials. There will be a good mixture of general chapters in both technology and applications in opto-electronics, X-ray detection and emerging optoelectronics applications. The book will hav...
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| Institution som forfatter: | |
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| Andre forfattere: | , |
| Format: | Electronisk eBog |
| Sprog: | engelsk |
| Udgivet: |
Cham :
Springer International Publishing : Imprint: Springer,
2023.
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| Udgivelse: | 1st ed. 2023. |
| Fag: | |
| Online adgang: | https://doi.org/10.1007/978-3-031-20955-0 |
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| Summary: | This book will provide readers with a good overview of some of most recent advances in the field of High-Z materials. There will be a good mixture of general chapters in both technology and applications in opto-electronics, X-ray detection and emerging optoelectronics applications. The book will have an in-depth review of the research topics from world-leading specialists in the field. Covers a broad range of topics, including novel material properties and applications of high-Z materials; Includes in-depth analysis on how to develop and use High-Z materials; Discusses analysis of applications in opto-electronics and for X-ray detection. |
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| Fysisk beskrivelse: | 1 online resource (IX, 246 p. 116 illus.). 92 illus. in color. |
| ISBN: | 9783031209550 |
| DOI: | 10.1007/978-3-031-20955-0 |