Analytical Methods and Instruments for Micro- and Nanomaterials

This book describes analytical instruments widely used to characterize the nanostructured materials. It provides information about how to assess material quality, defects, the state of surfaces and interfaces, element distributions, strain, lattice distortion, and electro-optical properties of mater...

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Những tác giả chính: Radamson, Henry H. (Tác giả), Hallén, Anders (Tác giả), Sychugov, Ilya (Tác giả), Azarov, Alexander (Tác giả)
Tác giả của công ty: SpringerLink (Online service)
Định dạng: Điện tử eBook
Ngôn ngữ:Tiếng Anh
Được phát hành: Cham : Springer International Publishing : Imprint: Springer, 2023.
Phiên bản:1st ed. 2023.
Loạt:Lecture Notes in Nanoscale Science and Technology, 23
Những chủ đề:
Truy cập trực tuyến:https://doi.org/10.1007/978-3-031-26434-4
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LEADER 00000nam a22000005i 4500
001 978-3-031-26434-4
003 DE-He213
005 20260810153935.0
007 cr nn 008mamaa
008 230810s2023 sz | o |||| 0|eng d
020 |a 9783031264344  |9 978-3-031-26434-4 
024 7 |a 10.1007/978-3-031-26434-4  |2 doi 
050 4 |a TA418.5-.84 
072 7 |a TGMT  |2 bicssc 
072 7 |a TEC021000  |2 bisacsh 
072 7 |a TGMT  |2 thema 
082 0 4 |a 620.112  |2 23 
100 1 |a Radamson, Henry H.  |e author.  |4 aut  |4 http://id.loc.gov/vocabulary/relators/aut 
245 1 0 |a Analytical Methods and Instruments for Micro- and Nanomaterials  |h [electronic resource] /  |c by Henry H. Radamson, Anders Hallén, Ilya Sychugov, Alexander Azarov. 
250 |a 1st ed. 2023. 
264 1 |a Cham :  |b Springer International Publishing :  |b Imprint: Springer,  |c 2023. 
300 |a 1 online resource (XVI, 282 p. 195 illus.).  |b 136 illus. in color. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
341 0 |b Table of contents navigation  |2 onix 
341 0 |b Single logical reading order  |2 onix 
341 0 |b Short alternative textual descriptions  |2 onix 
341 0 |b Use of color is not sole means of conveying information  |2 onix 
341 0 |b Use of high contrast between text and background color  |2 onix 
341 0 |b Next / Previous structural navigation  |2 onix 
341 0 |b All non-decorative content supports reading without sight  |2 onix 
347 |a text file  |b PDF  |2 rda 
490 1 |a Lecture Notes in Nanoscale Science and Technology,  |x 2195-2167 ;  |v 23 
505 0 |a Part one: Material Characterization using Photons and Electrons -- X-ray diffraction techniques -- Micro-photoluminescence (µ-PL) -- Spectroscopy techniques -- Electron Microscopy -- Part two: Material Characterization using Ions -- Rutherford backscattering Spectroscopy -- Secondary ion mass spectroscopy -- Part three: Electrical Measurements -- Electrical Characterization techniques -- Part four: Scanning Probe Techniques -- Scanning Probe Microscopies (SPMs). 
520 |a This book describes analytical instruments widely used to characterize the nanostructured materials. It provides information about how to assess material quality, defects, the state of surfaces and interfaces, element distributions, strain, lattice distortion, and electro-optical properties of materials and devices. The information provided by this book can be used as a back-up for material processing, material design and debugging of device performance. The basic principles and methodology of each analysis technique is described in separate chapters, adding historic perspectives and recent developments. The data analysis, from simple to advanced level, is introduced by numerous examples, mostly taken from the authors' fields of research; semiconductor materials, metals and oxides. The book serves as a valuable guide for scientists and students working in materials science, physics, and engineering, who wish to become acquainted with the most important analytical techniques for nanomaterials. . 
532 8 |a Accessibility summary: This PDF does not fully comply with PDF/UA standards, but does feature limited screen reader support, described non-text content (images, graphs), bookmarks for easy navigation and searchable, selectable text. Users of assistive technologies may experience difficulty navigating or interpreting content in this document. We recognize the importance of accessibility, and we welcome queries about accessibility for any of our products. If you have a question or an access need, please get in touch with us at accessibilitysupport@springernature.com. 
532 8 |a No reading system accessibility options actively disabled 
532 8 |a Publisher contact for further accessibility information: accessibilitysupport@springernature.com 
588 |a Print version record. 
650 0 |a Materials  |x Analysis. 
650 0 |a Nanoscience. 
650 0 |a Spectrum analysis. 
650 0 |a Optical materials. 
650 0 |a Nanotechnology. 
650 1 4 |a Characterization and Analytical Technique. 
650 2 4 |a Nanophysics. 
650 2 4 |a Spectroscopy. 
650 2 4 |a Optical Materials. 
650 2 4 |a Nanotechnology. 
650 2 4 |a Spectroscopy. 
700 1 |a Hallén, Anders.  |e author.  |0 (orcid)0000-0002-8760-1137  |1 https://orcid.org/0000-0002-8760-1137  |4 aut  |4 http://id.loc.gov/vocabulary/relators/aut 
700 1 |a Sychugov, Ilya.  |e author.  |4 aut  |4 http://id.loc.gov/vocabulary/relators/aut 
700 1 |a Azarov, Alexander.  |e author.  |4 aut  |4 http://id.loc.gov/vocabulary/relators/aut 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer Nature eBook 
776 0 8 |i Printed edition:  |z 9783031264337 
776 0 8 |i Printed edition:  |z 9783031264351 
776 0 8 |i Printed edition:  |z 9783031264368 
830 0 |a Lecture Notes in Nanoscale Science and Technology,  |x 2195-2167 ;  |v 23 
856 4 0 |u https://doi.org/10.1007/978-3-031-26434-4 
912 |a ZDB-2-CMS 
912 |a ZDB-2-SXC 
950 |a Chemistry and Materials Science (SpringerNature-11644) 
950 |a Chemistry and Material Science (R0) (SpringerNature-43709)