Analytical Methods and Instruments for Micro- and Nanomaterials
This book describes analytical instruments widely used to characterize the nanostructured materials. It provides information about how to assess material quality, defects, the state of surfaces and interfaces, element distributions, strain, lattice distortion, and electro-optical properties of mater...
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| Autors principals: | , , , |
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| Autor corporatiu: | |
| Format: | Electrònic eBook |
| Idioma: | anglès |
| Publicat: |
Cham :
Springer International Publishing : Imprint: Springer,
2023.
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| Edició: | 1st ed. 2023. |
| Col·lecció: | Lecture Notes in Nanoscale Science and Technology,
23 |
| Matèries: | |
| Accés en línia: | https://doi.org/10.1007/978-3-031-26434-4 |
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Taula de continguts:
- Part one: Material Characterization using Photons and Electrons
- X-ray diffraction techniques
- Micro-photoluminescence (µ-PL)
- Spectroscopy techniques
- Electron Microscopy
- Part two: Material Characterization using Ions
- Rutherford backscattering Spectroscopy
- Secondary ion mass spectroscopy
- Part three: Electrical Measurements
- Electrical Characterization techniques
- Part four: Scanning Probe Techniques
- Scanning Probe Microscopies (SPMs).