Citace podle APA (7th ed.)

SpringerLink (Online service), van Driel, W. D., Pressel, K., & Soyturk, M. (2024). Recent Advances in Microelectronics Reliability: Contributions from the European ECSEL JU project iRel40 (1st ed. 2024.). Springer International Publishing : Imprint: Springer. https://doi.org/10.1007/978-3-031-59361-1

Citace podle Chicago (17th ed.)

SpringerLink (Online service), Willem Dirk van Driel, Klaus Pressel, a Mujdat Soyturk. Recent Advances in Microelectronics Reliability: Contributions from the European ECSEL JU Project IRel40. 1st ed. 2024. Cham: Springer International Publishing : Imprint: Springer, 2024. https://doi.org/10.1007/978-3-031-59361-1.

Citace podle MLA (9th ed.)

SpringerLink (Online service), et al. Recent Advances in Microelectronics Reliability: Contributions from the European ECSEL JU Project IRel40. 1st ed. 2024. Springer International Publishing : Imprint: Springer, 2024. https://doi.org/10.1007/978-3-031-59361-1.

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