Characterization of Minerals, Metals, and Materials 2025 In-Situ Characterization Techniques /

The collection focuses on the advancements of characterization of minerals, metals, and materials and the applications of characterization results on the processing of these materials. Advanced characterization methods, techniques, and new instruments are emphasized. Areas of interest include but ar...

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Bibliografiske detaljer
Institution som forfatter: SpringerLink (Online service)
Andre forfattere: Peng, Zhiwei (Editor), Xie, Kelvin Yu (Editor), Zhang, Mingming (Editor), Li, Jian (Editor), Li, Bowen (Editor), Monteiro, Sergio Neves (Editor), Soman, Rajiv (Editor), Hwang, Jiann-Yang (Editor), Kalay, Yunus Eren (Editor), Escobedo-Diaz, Juan P. (Editor), Carpenter, John S. (Editor), Brown, Andrew D. (Editor), Ikhmayies, Shadia (Editor)
Format: Electronisk eBog
Sprog:engelsk
Udgivet: Cham : Springer Nature Switzerland : Imprint: Springer, 2025.
Udgivelse:1st ed. 2025.
Serier:The Minerals, Metals & Materials Series,
Fag:
Online adgang:https://doi.org/10.1007/978-3-031-80680-3
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Beskrivelse
Summary:The collection focuses on the advancements of characterization of minerals, metals, and materials and the applications of characterization results on the processing of these materials. Advanced characterization methods, techniques, and new instruments are emphasized. Areas of interest include but are not limited to: Extraction and processing of various types of minerals, process-structure-property relationship of metal alloys, glasses, ceramics, polymers, composites, semiconductors, and carbon using functional and structural materials Novel methods and techniques for characterizing materials across a spectrum of systems and processes Characterization of mechanical, thermal, electrical, optical, dielectric, magnetic, physical, and other properties of metals, polymers, and ceramics including battery materials Characterization of structural, morphological, and topographical natures of materials at micro- and nano-scales Characterization of extraction and processing including process development and analysis Advances in instrument development for microstructure analysis and performance evaluation of materials, such as computer tomography (CT), X-ray and neutron diffraction, electron microscopy (SEM, FIB, TEM), and spectroscopy (EDS, WDS, EBSD) techniques 2D and 3D modelling for materials characterization.
Fysisk beskrivelse:XXV, 531 p. 266 illus., 228 illus. in color. online resource.
ISBN:9783031806803
ISSN:2367-1696
DOI:10.1007/978-3-031-80680-3