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Metrology and Measurement Uncertainty Concepts and Applications /

This book presents in a clear, didactic, and straightforward manner, the concepts, tools and technical terminology needed to understand metrological issues in industry and laboratories. Using examples of calibration and detailed critical analysis of the certificates, the book explores metrology and...

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Hlavní autoři: Novellino do Rosario, Pedro Paulo (Autor), Mendes, Alexandre (Autor)
Korporativní autor: SpringerLink (Online service)
Médium: Elektronický zdroj E-kniha
Jazyk:angličtina
Vydáno: Cham : Springer Nature Switzerland : Imprint: Springer, 2025.
Vydání:1st ed. 2025.
Témata:
Measurement.
Measuring instruments.
Atoms.
Metrology.
Optical measurements.
Quantum physics.
Nanotechnology.
Measurement Science and Instrumentation.
Metrology and Fundamental Constants.
Optical Metrology.
Quantum Measurement and Metrology.
Nanometrology.
On-line přístup:https://doi.org/10.1007/978-3-031-82303-9
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Obsah:
  • International System of Units
  • Knowing metrology and its international structure
  • Statistics applied to metrology
  • Measurement systems
  • Evaluating of measure uncertainty in direct measurements
  • Evaluating of measure uncertainty in indirect measurements
  • Industrial calibration
  • Measurement uncertainty and conformity assessment
  • Critical analysis of calibration certificates.

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