VLSI for Embedded Intelligence Proceedings of the 27th International Symposium, VDAT 2023 /

This book constitutes the proceedings of the 27th International Symposium on VLSI Design and Test, VDAT 2023. The 32 regular papers and 16 short papers presented in this book are carefully reviewed and selected from 220 submissions. They are organized in topical sections as follows: Low-Power Integr...

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Соавтор: SpringerLink (Online service)
Другие авторы: Gupta, Anu (Редактор), Pandey, Jai Gopal (Редактор), Chaturvedi, Nitin (Редактор), Dwivedi, Devesh (Редактор)
Формат: Электронный ресурс eКнига
Язык:английский
Опубликовано: Singapore : Springer Nature Singapore : Imprint: Springer, 2025.
Редактирование:1st ed. 2025.
Серии:Lecture Notes in Electrical Engineering, 1210
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Online-ссылка:https://doi.org/10.1007/978-981-97-3756-7
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Итог:This book constitutes the proceedings of the 27th International Symposium on VLSI Design and Test, VDAT 2023. The 32 regular papers and 16 short papers presented in this book are carefully reviewed and selected from 220 submissions. They are organized in topical sections as follows: Low-Power Integrated Circuits and Devices; FPGA-Based Design and Embedded Systems; Memory, Computing, and Processor Design; CAD for VLSI; Emerging Integrated Circuits and Systems; VLSI Testing and Security; and System-Level Design.
Объем:1 online resource (XX, 396 p. 230 illus.). 179 illus. in color.
ISBN:9789819737567
ISSN:1876-1119 ;
DOI:10.1007/978-981-97-3756-7