Applied Scanning Probe Methods IX: Characterization /
Tallennettuna:
| Päätekijä: | |
|---|---|
| Muut tekijät: | |
| Aineistotyyppi: | Kirja |
| Kieli: | englanti |
| Julkaistu: |
Berlin:
Springer,
c2008.
|
| Painos: | 1st ed. |
| Sarja: | NanoScience and Technology
|
| Aiheet: | |
| Tagit: |
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MARC
| LEADER | 00000nam a2200000 i 4500 | ||
|---|---|---|---|
| 001 | JU-IMPORT-001306 | ||
| 003 | BD-SaJUCL | ||
| 005 | 20260915021836.0 | ||
| 008 | 260915s2008 xx 000 0 eng d | ||
| 040 | |a BD-SaJUCL |b eng |c BD-SaJUCL |e rda | ||
| 100 | 1 | |a Bhushan, Bharat | |
| 700 | 1 | |a Fuchs, Harald | |
| 245 | 1 | 0 | |a Applied Scanning Probe Methods IX: |b Characterization / |c Bharat Bhushan, Harald Fuchs and Masahiko Tomitori |
| 264 | 1 | |a Berlin: |b Springer, |c c2008. | |
| 250 | |a 1st ed. | ||
| 300 | |a xvi, 387p. | ||
| 490 | 1 | |a NanoScience and Technology | |
| 504 | |a Includes bibliographical references and index. | ||
| 650 | 0 | |a Scanning probe microscopy | |
| 650 | 0 | |a Surfaces (Technology)--Analysis | |
| 650 | 0 | |a Nanotechnology | |
| 020 | |a 9783540740834 | ||
| 082 | 0 | 4 | |a 502.82 |b B57 |2 23 |
| 942 | |c BK |n 0 | ||
| 999 | |c 94106 |d 94100 | ||