Applied Scanning Probe Methods IX Characterization
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| Hlavní autor: | |
|---|---|
| Médium: | Kniha |
| Jazyk: | angličtina |
| Vydáno: |
Berlin
Springer
c2008
|
| Vydání: | 1st ed |
| Témata: | |
| Tagy: |
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MARC
| LEADER | 00000nam a2200000 i 4500 | ||
|---|---|---|---|
| 001 | JU-Physics-CONSOLIDATED-000005 | ||
| 003 | BD-SaJUCL | ||
| 005 | 20260920035952.0 | ||
| 008 | 260916s2020 xx 000 0 eng d | ||
| 040 | |a BD-SaJUCL |b eng |c BD-SaJUCL |e rda | ||
| 020 | |a 9783540740834 | ||
| 082 | 0 | 4 | |a 502.82 |b B575a |2 23 |
| 100 | 1 | |a Bhushan, Bharat | |
| 245 | 1 | 0 | |a Applied Scanning Probe Methods IX |b Characterization |c Bharat Bhushan, Harald Fuchs and Masahiko Tomitori |
| 250 | |a 1st ed | ||
| 264 | 1 | |a Berlin |b Springer |c c2008 | |
| 300 | |a xvi, 387p | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a unmediated |b n |2 rdamedia | ||
| 338 | |a volume |b nc |2 rdacarrier | ||
| 504 | |a Includes bibliographical references and index | ||
| 650 | 0 | |a Scanning probe microscopy | |
| 650 | 0 | |a Surfaces (Technology)--Analysis | |
| 650 | 0 | |a Nanotechnology | |
| 942 | |c BK |n 0 | ||
| 999 | |c 112788 |d 112788 | ||