Surface Analysis with STM and AFM Experimental and Theoretical Aspects of Image Analysis
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| Format: | Buch |
| Sprache: | Englisch |
| Veröffentlicht: |
Weinheim
VCH
c1996
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| Schlagworte: | |
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| LEADER | 00000nam a2200000 i 4500 | ||
|---|---|---|---|
| 001 | JU-Physics-CONSOLIDATED-000109 | ||
| 003 | BD-SaJUCL | ||
| 005 | 20260920035952.0 | ||
| 008 | 260916s2020 xx 000 0 eng d | ||
| 040 | |a BD-SaJUCL |b eng |c BD-SaJUCL |e rda | ||
| 020 | |a 3-527-29313-2 | ||
| 082 | 0 | 4 | |a 530.417 |b M211s |2 23 |
| 100 | 1 | |a Magonov, Sergei N | |
| 245 | 1 | 0 | |a Surface Analysis with STM and AFM |b Experimental and Theoretical Aspects of Image Analysis |c Sergei N. Magonov, Myung-Hwan Whangbo |
| 264 | 1 | |a Weinheim |b VCH |c c1996 | |
| 300 | |a 323p | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a unmediated |b n |2 rdamedia | ||
| 338 | |a volume |b nc |2 rdacarrier | ||
| 504 | |a Includes bibliographical references and index | ||
| 650 | 0 | |a Surface analysis | |
| 650 | 0 | |a Scanning tunneling microscopy | |
| 650 | 0 | |a Atomic force microscopy | |
| 942 | |c BK |n 0 | ||
| 999 | |c 112893 |d 112893 | ||