Applied Scanning Probe Methods IX Characterization
সংরক্ষণ করুন:
| প্রধান লেখক: | |
|---|---|
| বিন্যাস: | গ্রন্থ |
| ভাষা: | ইংরেজি |
| প্রকাশিত: |
Berlin
Springer
c2008
|
| বিষয়গুলি: | |
| ট্যাগগুলো: |
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MARC
| LEADER | 00000nam a2200000 i 4500 | ||
|---|---|---|---|
| 001 | JU-Physics-CONSOLIDATED-000112 | ||
| 003 | BD-SaJUCL | ||
| 005 | 20260920035952.0 | ||
| 008 | 260916s2020 xx 000 0 eng d | ||
| 040 | |a BD-SaJUCL |b eng |c BD-SaJUCL |e rda | ||
| 020 | |a 978-3-540-74082-7 | ||
| 082 | 0 | 4 | |a 502.82 |b B575a |2 23 |
| 100 | 1 | |a Bhushan, Bharat | |
| 245 | 1 | 0 | |a Applied Scanning Probe Methods IX |b Characterization |c edited by Bharat Bhushan, Harald Fuchs, Masahiko Tomitori |
| 264 | 1 | |a Berlin |b Springer |c c2008 | |
| 300 | |a 362p | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a unmediated |b n |2 rdamedia | ||
| 338 | |a volume |b nc |2 rdacarrier | ||
| 504 | |a Includes bibliographical references and index | ||
| 650 | 0 | |a Scanning probe microscopy | |
| 650 | 0 | |a Nanotechnology | |
| 650 | 0 | |a Surface analysis | |
| 942 | |c BK |n 0 | ||
| 999 | |c 112896 |d 112896 | ||