Applied logistic regression/

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Bibliographic Details
Main Author: Hosmer, David W
Other Authors: Lemeshow, Stanley
Format: Book
Language:English
Published: New York: John Wiley, c1989.
Series:(Wiley series in probability and mathematical statistics)
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Description
Item Description:"A Wiley-Interscience Publication".
Physical Description:xiii, 307p.: ill. ; 24cm.
Bibliography:Bibliography: p. 291-300. Includes index and tables.