High resolution X-ray diffractometry and topography/

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Bibliographic Details
Main Author:	Bowen, D. Keith
Format:	Book
Language:	English
Published:	London: Taylor & Francis, c1998
Subjects:	1. X-rays-Diffraction i. Title
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UL

Holdings details from UL
Call Number:	548.83 B786h
Copy	Not For Loan