Cita APA (7th ed.)

Bowen, D. K. (1998). High resolution X-ray diffractometry and topography. Taylor & Francis.

Cita Chicago (17th ed.)

Bowen, D. Keith. High Resolution X-ray Diffractometry and Topography. London: Taylor & Francis, 1998.

Cita MLA (9th ed.)

Bowen, D. Keith. High Resolution X-ray Diffractometry and Topography. Taylor & Francis, 1998.

Atenció: Aquestes cites poden no estar 100% correctes.