Bowen, D. K. (1998). High resolution X-ray diffractometry and topography. Taylor & Francis.
Cita Chicago (17th ed.)Bowen, D. Keith. High Resolution X-ray Diffractometry and Topography. London: Taylor & Francis, 1998.
Cita MLA (9th ed.)Bowen, D. Keith. High Resolution X-ray Diffractometry and Topography. Taylor & Francis, 1998.
Atenció: Aquestes cites poden no estar 100% correctes.