Bowen, D. K. (1998). High resolution X-ray diffractometry and topography. Taylor & Francis.
Cita Chicago Style (17a ed.)Bowen, D. Keith. High Resolution X-ray Diffractometry and Topography. London: Taylor & Francis, 1998.
Cita MLA (9a ed.)Bowen, D. Keith. High Resolution X-ray Diffractometry and Topography. Taylor & Francis, 1998.
Precaución: Estas citas no son 100% exactas.