Bowen, D. K. (1998). High resolution X-ray diffractometry and topography. Taylor & Francis.
Chicago Style (17th ed.) ZitazioaBowen, D. Keith. High Resolution X-ray Diffractometry and Topography. London: Taylor & Francis, 1998.
MLA (9th ed.) ZitazioaBowen, D. Keith. High Resolution X-ray Diffractometry and Topography. Taylor & Francis, 1998.
Kontuz: berrikusi erreferentzia hauek erabili aurretik.