Cita APA

Bowen, D. K. (1998). High resolution X-ray diffractometry and topography. Taylor & Francis.

Citación estilo Chicago

Bowen, D. Keith. High Resolution X-ray Diffractometry and Topography. London: Taylor & Francis, 1998.

Cita MLA

Bowen, D. Keith. High Resolution X-ray Diffractometry and Topography. Taylor & Francis, 1998.

Warning: These citations may not always be 100% accurate.