Bowen, D. K. (1998). High resolution X-ray diffractometry and topography. Taylor & Francis.
Chicago Style (17th ed.) CitationBowen, D. Keith. High Resolution X-ray Diffractometry and Topography. London: Taylor & Francis, 1998.
ציטוט MLABowen, D. Keith. High Resolution X-ray Diffractometry and Topography. Taylor & Francis, 1998.
אזהרה: ציטוטים אלה לעיתים לא מדויקים ב 100%.