Bowen, D. K. (1998). High resolution X-ray diffractometry and topography. Taylor & Francis.
Citazione stile Chigago Style (17a edizione)Bowen, D. Keith. High Resolution X-ray Diffractometry and Topography. London: Taylor & Francis, 1998.
Citatione MLA (9a ed.)Bowen, D. Keith. High Resolution X-ray Diffractometry and Topography. Taylor & Francis, 1998.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.