Bowen, D. K. (1998). High resolution X-ray diffractometry and topography. Taylor & Francis.
Chicago (17e ed.) BronvermeldingBowen, D. Keith. High Resolution X-ray Diffractometry and Topography. London: Taylor & Francis, 1998.
MLA (9e ed.) BronvermeldingBowen, D. Keith. High Resolution X-ray Diffractometry and Topography. Taylor & Francis, 1998.
Let op: Deze citaties zijn niet altijd 100% accuraat.