APA citiranje

Bowen, D. K. (1998). High resolution X-ray diffractometry and topography. Taylor & Francis.

Chicago Style (17th ed.) Citation

Bowen, D. Keith. High Resolution X-ray Diffractometry and Topography. London: Taylor & Francis, 1998.

MLA citiranje

Bowen, D. Keith. High Resolution X-ray Diffractometry and Topography. Taylor & Francis, 1998.

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