APA引文

Bowen, D. K. (1998). High resolution X-ray diffractometry and topography. Taylor & Francis.

Chicago Style (17th ed.) Citation

Bowen, D. Keith. High Resolution X-ray Diffractometry and Topography. London: Taylor & Francis, 1998.

MLA引文

Bowen, D. Keith. High Resolution X-ray Diffractometry and Topography. Taylor & Francis, 1998.

警告：這些引文格式不一定是100％准確.