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High resolution X-ray diffractometry and topography/

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Dades bibliogràfiques
Autor principal:	Bowen, D. Keith
Format:	Llibre
Idioma:	anglès
Publicat:	London: Taylor & Francis, c1998
Matèries:	1. X-rays-Diffraction i. Title
Etiquetes:	Afegir etiqueta Sense etiquetes, Sigues el primer a etiquetar aquest registre!

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