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High resolution X-ray diffractometry and topography/

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Detalles Bibliográficos
Autor principal:	Bowen, D. Keith
Formato:	Libro
Lenguaje:	inglés
Publicado:	London: Taylor & Francis, c1998
Materias:	1. X-rays-Diffraction i. Title
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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