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High resolution X-ray diffractometry and topography/

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Библиографические подробности
Главный автор:	Bowen, D. Keith
Формат:	‌
Язык:	английский
Опубликовано:	London: Taylor & Francis, c1998
Предметы:	1. X-rays-Diffraction i. Title
Метки:	Добавить метку Нет меток, Требуется 1-ая метка записи!

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