Active Probe Atomic Force Microscopy A Practical Guide on Precision Instrumentation /

From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM). Centered around AFM, a broad range of mechatronic system topics are covered including mechanics, sensors, actuators, transmission design, sys...

詳細記述

書誌詳細

主要な著者:	Xia, Fangzhou (著者), Rangelow, Ivo W. (著者), Youcef-Toumi, Kamal (著者)
団体著者:	SpringerLink (Online service)
フォーマット:	電子媒体 eBook
言語:	英語
出版事項:	Cham : Springer International Publishing : Imprint: Springer, 2024.
版:	1st ed. 2024.
主題:	Measurement. Measuring instruments. Electronics. Mechatronics. Spectrum analysis. Microtechnology. Microelectromechanical systems. Measurement Science and Instrumentation. Electronics and Microelectronics, Instrumentation. Spectroscopy. Microsystems and MEMS.
オンライン･アクセス:	https://doi.org/10.1007/978-3-031-44233-9
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