APA ציטוט

Xia, F., Rangelow, I. W., & Youcef-Toumi, K. (2024). Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation (1st ed. 2024.). Springer International Publishing : Imprint: Springer. https://doi.org/10.1007/978-3-031-44233-9

Chicago Style (17th ed.) Citation

Xia, Fangzhou, Ivo W. Rangelow, and Kamal Youcef-Toumi. Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation. 1st ed. 2024. Cham: Springer International Publishing : Imprint: Springer, 2024. https://doi.org/10.1007/978-3-031-44233-9.

ציטוט MLA

Xia, Fangzhou, et al. Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation. 1st ed. 2024. Springer International Publishing : Imprint: Springer, 2024. https://doi.org/10.1007/978-3-031-44233-9.