Active Probe Atomic Force Microscopy A Practical Guide on Precision Instrumentation /
From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM). Centered around AFM, a broad range of mechatronic system topics are covered including mechanics, sensors, actuators, transmission design, sys...
Wedi'i Gadw mewn:
| Prif Awduron: | , , |
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| Awdur Corfforaethol: | |
| Fformat: | Electronig eLyfr |
| Iaith: | Saesneg |
| Cyhoeddwyd: |
Cham :
Springer International Publishing : Imprint: Springer,
2024.
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| Rhifyn: | 1st ed. 2024. |
| Pynciau: | |
| Mynediad Ar-lein: | https://doi.org/10.1007/978-3-031-44233-9 |
| Tagiau: |
Ychwanegu Tag
Dim Tagiau, Byddwch y cyntaf i dagio'r cofnod hwn!
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MARC
| LEADER | 00000nam a22000005i 4500 | ||
|---|---|---|---|
| 001 | 978-3-031-44233-9 | ||
| 003 | DE-He213 | ||
| 005 | 20260906075946.0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 240206s2024 sz | o |||| 0|eng d | ||
| 020 | |a 9783031442339 |9 978-3-031-44233-9 | ||
| 024 | 7 | |a 10.1007/978-3-031-44233-9 |2 doi | |
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| 100 | 1 | |a Xia, Fangzhou. |e author. |4 aut |4 http://id.loc.gov/vocabulary/relators/aut | |
| 245 | 1 | 0 | |a Active Probe Atomic Force Microscopy |h [electronic resource] : |b A Practical Guide on Precision Instrumentation / |c by Fangzhou Xia, Ivo W. Rangelow, Kamal Youcef-Toumi. |
| 250 | |a 1st ed. 2024. | ||
| 264 | 1 | |a Cham : |b Springer International Publishing : |b Imprint: Springer, |c 2024. | |
| 300 | |a 1 online resource (XXIV, 366 p. 138 illus.). |b 125 illus. in color. | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 341 | 0 | |b Table of contents navigation |2 onix | |
| 341 | 0 | |b Single logical reading order |2 onix | |
| 341 | 0 | |b Short alternative textual descriptions |2 onix | |
| 341 | 0 | |b Use of colour is Not sole means of conveying information |2 onix | |
| 341 | 0 | |b Use of high contrast between text and background colour |2 onix | |
| 341 | 0 | |b Next / Previous structural navigation |2 onix | |
| 341 | 0 | |b All Non-decorative content supports reading without sight |2 onix | |
| 347 | |a text file |b PDF |2 rda | ||
| 505 | 0 | |a Introduction -- Active Probe Design and Fabrication -- Advanced Applications of Active Probes -- Atomic Force Microscope Designs -- AFM System using Active Probe -- A Low-cost AFM Design for Engineering Education -- Appendix. | |
| 520 | |a From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM). Centered around AFM, a broad range of mechatronic system topics are covered including mechanics, sensors, actuators, transmission design, system identification, signal processing, dynamic system modeling, controller. With a solid theoretical foundation, practical examples are provided for AFM subsystem level design on nano-positioning system, cantilever probe, control system and system integration. This book emphasizes novel development of active cantilever probes with embedded transducers, which enables new AFM capabilities for advanced applications. Full design details of a low-cost educational AFM and a Scale Model Interactive Learning Extended Reality (SMILER) toolkit are provided, which helps instructors to make use of this book for curriculum development. This book aims to empower AFM users with deeper understanding of theinstrument to extend AFM functionalities for advanced state-of-the-art research studies. Going beyond AFM, materials presented in this book are widely applicable to precision mechatronic system design covered in many upper-level graduate courses in mechanical and electrical engineering to cultivate next generation instrumentalists. Presents the instrument design details of atomic force microscopy with focus on active cantilever probes; Includes examples and exercises to boost understanding of AFM subsystem design, fabrication and integration; Imparts a hands-on curriculum for precision mechatronics and instrumentation with AFM and digital twin simulators. | ||
| 532 | 8 | |a Accessibility summary: This PDF does Not fully comply with PDF/UA standards but does include limited screen reader support, descriptions for Non-text content (such as images and graphs), bookmarks for easy navigation, and searchable, selectable text. Users of assistive technologies may experience difficulty navigating or interpreting content in this document. We recognise the importance of accessibility and welcome queries about accessibility for any of our products. If you have a question or an access need, please get in touch with us via https://www.springernature.com/gp/info/accessibility | |
| 532 | 8 | |a Inaccessible, or known limited accessibility | |
| 532 | 8 | |a No reading system accessibility options actively disabled | |
| 532 | 8 | |a Publisher contact for further accessibility information: accessibilitysupport@springernature.com | |
| 588 | |a Print version record. | ||
| 650 | 0 | |a Measurement. | |
| 650 | 0 | |a Measuring instruments. | |
| 650 | 0 | |a Electronics. | |
| 650 | 0 | |a Mechatronics. | |
| 650 | 0 | |a Spectrum analysis. | |
| 650 | 0 | |a Microtechnology. | |
| 650 | 0 | |a Microelectromechanical systems. | |
| 650 | 1 | 4 | |a Measurement Science and Instrumentation. |
| 650 | 2 | 4 | |a Electronics and Microelectronics, Instrumentation. |
| 650 | 2 | 4 | |a Mechatronics. |
| 650 | 2 | 4 | |a Spectroscopy. |
| 650 | 2 | 4 | |a Microsystems and MEMS. |
| 700 | 1 | |a Rangelow, Ivo W. |e author. |4 aut |4 http://id.loc.gov/vocabulary/relators/aut | |
| 700 | 1 | |a Youcef-Toumi, Kamal. |e author. |4 aut |4 http://id.loc.gov/vocabulary/relators/aut | |
| 710 | 2 | |a SpringerLink (Online service) | |
| 773 | 0 | |t Springer Nature eBook | |
| 776 | 0 | 8 | |i Printed edition: |z 9783031442322 |
| 776 | 0 | 8 | |i Printed edition: |z 9783031442346 |
| 776 | 0 | 8 | |i Printed edition: |z 9783031442353 |
| 856 | 4 | 0 | |u https://doi.org/10.1007/978-3-031-44233-9 |
| 912 | |a ZDB-2-PHA | ||
| 912 | |a ZDB-2-SXP | ||
| 950 | |a Physics and Astronomy (SpringerNature-11651) | ||
| 950 | |a Physics and Astronomy (R0) (SpringerNature-43715) | ||