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Active Probe Atomic Force Microscopy A Practical Guide on Precision Instrumentation /

From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM). Centered around AFM, a broad range of mechatronic system topics are covered including mechanics, sensors, actuators, transmission design, sys...

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Detalhes bibliográficos
Main Authors:	Xia, Fangzhou (Author), Rangelow, Ivo W. (Author), Youcef-Toumi, Kamal (Author)
Autor Corporativo:	SpringerLink (Online service)
Formato:	Recurso Electrónico livro electrónico
Idioma:	inglês
Publicado em:	Cham : Springer International Publishing : Imprint: Springer, 2024.
Edição:	1st ed. 2024.
Assuntos:	Measurement. Measuring instruments. Electronics. Mechatronics. Spectrum analysis. Microtechnology. Microelectromechanical systems. Measurement Science and Instrumentation. Electronics and Microelectronics, Instrumentation. Spectroscopy. Microsystems and MEMS.
Acesso em linha:	https://doi.org/10.1007/978-3-031-44233-9
Tags:	Adicionar Tag Sem tags, seja o primeiro a adicionar uma tag!

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