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Active Probe Atomic Force Microscopy A Practical Guide on Precision Instrumentation /

From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM). Centered around AFM, a broad range of mechatronic system topics are covered including mechanics, sensors, actuators, transmission design, sys...

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Autors principals: Xia, Fangzhou (Autor), Rangelow, Ivo W. (Autor), Youcef-Toumi, Kamal (Autor)
Autor corporatiu: SpringerLink (Online service)
Format: Electrònic eBook
Idioma:anglès
Publicat: Cham : Springer International Publishing : Imprint: Springer, 2024.
Edició:1st ed. 2024.
Matèries:
Measurement.
Measuring instruments.
Electronics.
Mechatronics.
Spectrum analysis.
Microtechnology.
Microelectromechanical systems.
Measurement Science and Instrumentation.
Electronics and Microelectronics, Instrumentation.
Spectroscopy.
Microsystems and MEMS.
Accés en línia:https://doi.org/10.1007/978-3-031-44233-9
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Taula de continguts:
  • Introduction
  • Active Probe Design and Fabrication
  • Advanced Applications of Active Probes
  • Atomic Force Microscope Designs
  • AFM System using Active Probe
  • A Low-cost AFM Design for Engineering Education
  • Appendix.

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