Machine Learning and Knowledge Discovery in Databases. Research Track and Demo Track European Conference, ECML PKDD 2024, Vilnius, Lithuania, September 9–13, 2024, Proceedings, Part VIII /

Chapter “Pattern or Artifact? Interactively Exploring Embedding Quality with TRACE” is available open access under a Creative Commons Attribution 4.0 International License via link.springer.com.

Podrobná bibliografie

Korporativní autor:	SpringerLink (Online service)
Další autoři:	Bifet, Albert (Editor), Daniušis, Povilas (Editor), Davis, Jesse (Editor), Krilavičius, Tomas (Editor), Kull, Meelis (Editor), Ntoutsi, Eirini (Editor), Puolamäki, Kai (Editor), Žliobaitė, Indrė (Editor)
Médium:	Elektronický zdroj E-kniha
Jazyk:	angličtina
Vydáno:	Cham : Springer Nature Switzerland : Imprint: Springer, 2024.
Vydání:	1st ed. 2024.
Edice:	Lecture Notes in Artificial Intelligence, 14948
Témata:	Artificial intelligence. Computer engineering. Computer networks . Computers. Image processing > Digital techniques. Computer vision. Software engineering. Artificial Intelligence. Computer Engineering and Networks. Computing Milieux. Computer Imaging, Vision, Pattern Recognition and Graphics. Software Engineering.
On-line přístup:	https://doi.org/10.1007/978-3-031-70371-3
Tagy:	Přidat tag Žádné tagy, Buďte první, kdo vytvoří štítek k tomuto záznamu!