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Machine Learning and Knowledge Discovery in Databases. Research Track and Demo Track European Conference, ECML PKDD 2024, Vilnius, Lithuania, September 9–13, 2024, Proceedings, Part VIII /

Chapter “Pattern or Artifact? Interactively Exploring Embedding Quality with TRACE” is available open access under a Creative Commons Attribution 4.0 International License via link.springer.com.

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Xehetasun bibliografikoak
Erakunde egilea:	SpringerLink (Online service)
Beste egile batzuk:	Bifet, Albert (Argitaratzailea), Daniušis, Povilas (Argitaratzailea), Davis, Jesse (Argitaratzailea), Krilavičius, Tomas (Argitaratzailea), Kull, Meelis (Argitaratzailea), Ntoutsi, Eirini (Argitaratzailea), Puolamäki, Kai (Argitaratzailea), Žliobaitė, Indrė (Argitaratzailea)
Formatua:	Baliabide elektronikoa eBook
Hizkuntza:	ingelesa
Argitaratua:	Cham : Springer Nature Switzerland : Imprint: Springer, 2024.
Edizioa:	1st ed. 2024.
Saila:	Lecture Notes in Artificial Intelligence, 14948
Gaiak:	Artificial intelligence. Computer engineering. Computer networks . Computers. Image processing > Digital techniques. Computer vision. Software engineering. Artificial Intelligence. Computer Engineering and Networks. Computing Milieux. Computer Imaging, Vision, Pattern Recognition and Graphics. Software Engineering.
Sarrera elektronikoa:	https://doi.org/10.1007/978-3-031-70371-3
Etiketak:	Etiketa erantsi Etiketarik gabe, Izan zaitez lehena erregistro honi etiketa jartzen!

Deskribapena
Gaia:	Chapter “Pattern or Artifact? Interactively Exploring Embedding Quality with TRACE” is available open access under a Creative Commons Attribution 4.0 International License via link.springer.com.
Deskribapen fisikoa:	LVIII, 436 p. 145 illus., 131 illus. in color. online resource.
ISBN:	9783031703713
ISSN:	2945-9141 ;
DOI:	10.1007/978-3-031-70371-3