Machine Learning and Knowledge Discovery in Databases. Research Track and Demo Track European Conference, ECML PKDD 2024, Vilnius, Lithuania, September 9–13, 2024, Proceedings, Part VIII /

Chapter “Pattern or Artifact? Interactively Exploring Embedding Quality with TRACE” is available open access under a Creative Commons Attribution 4.0 International License via link.springer.com.

Bibliographic Details

Corporate Author:	SpringerLink (Online service)
Other Authors:	Bifet, Albert (Editor), Daniušis, Povilas (Editor), Davis, Jesse (Editor), Krilavičius, Tomas (Editor), Kull, Meelis (Editor), Ntoutsi, Eirini (Editor), Puolamäki, Kai (Editor), Žliobaitė, Indrė (Editor)
Format:	Electronic eBook
Language:	English
Published:	Cham : Springer Nature Switzerland : Imprint: Springer, 2024.
Edition:	1st ed. 2024.
Series:	Lecture Notes in Artificial Intelligence, 14948
Subjects:	Artificial intelligence. Computer engineering. Computer networks . Computers. Image processing > Digital techniques. Computer vision. Software engineering. Artificial Intelligence. Computer Engineering and Networks. Computing Milieux. Computer Imaging, Vision, Pattern Recognition and Graphics. Software Engineering.
Online Access:	https://doi.org/10.1007/978-3-031-70371-3
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