Fundamentals of Electromigration-Aware Integrated Circuit Design

The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. This second edition has been updated to introduce recent advancements in the understanding of the physical process of electromigration, which gives the reader the knowledge for a...

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Bibliografiske detaljer
Main Authors: Lienig, Jens (Author), Rothe, Susann (Author), Thiele, Matthias (Author)
Institution som forfatter: SpringerLink (Online service)
Format: Electronisk eBog
Sprog:engelsk
Udgivet: Cham : Springer Nature Switzerland : Imprint: Springer, 2025.
Udgivelse:2nd ed. 2025.
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Online adgang:https://doi.org/10.1007/978-3-031-80023-8
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https://doi.org/10.1007/978-3-031-80023-8