Fundamentals of Electromigration-Aware Integrated Circuit Design

The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. This second edition has been updated to introduce recent advancements in the understanding of the physical process of electromigration, which gives the reader the knowledge for a...

Whakaahuatanga katoa

I tiakina i:
Ngā taipitopito rārangi puna kōrero
Ngā kaituhi matua: Lienig, Jens (Author), Rothe, Susann (Author), Thiele, Matthias (Author)
Kaituhi rangatōpū: SpringerLink (Online service)
Hōputu: Tāhiko īPukapuka
Reo:Ingarihi
I whakaputaina: Cham : Springer Nature Switzerland : Imprint: Springer, 2025.
Putanga:2nd ed. 2025.
Ngā marau:
Urunga tuihono:https://doi.org/10.1007/978-3-031-80023-8
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Rārangi ihirangi:
  • Introduction
  • Fundamentals of Electromigration
  • Integrated Circuit Design and Electromigration
  • Mitigating Electromigration in Physical Design
  • Summary and Outlook.