Fundamentals of Electromigration-Aware Integrated Circuit Design

The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. This second edition has been updated to introduce recent advancements in the understanding of the physical process of electromigration, which gives the reader the knowledge for a...

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Bibliographic Details

Main Authors:	Lienig, Jens (Author), Rothe, Susann (Author), Thiele, Matthias (Author)
Corporate Author:	SpringerLink (Online service)
Format:	Electronic eBook
Language:	English
Published:	Cham : Springer Nature Switzerland : Imprint: Springer, 2025.
Edition:	2nd ed. 2025.
Subjects:	Electronic circuits. Microprocessors. Computer architecture. Electronics. Electronic Circuits and Systems. Processor Architectures. Electronics and Microelectronics, Instrumentation.
Online Access:	https://doi.org/10.1007/978-3-031-80023-8
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