Reliability of CMOS Analog ICs

This book presents recent advances in reliability investigation of MOS transistors and their applications. Theory and experimental results are discussed, in order to demonstrate the efficacy of the techniques presented. Readers will be enabled to improve their designs in application areas of analog...

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Hlavní autoři:	Kuntman, Hakan (Autor), Özenli, Deniz (Autor), Kaçar, Fırat (Autor), Özçelep, Yasin (Autor)
Korporativní autor:	SpringerLink (Online service)
Médium:	Elektronický zdroj E-kniha
Jazyk:	angličtina
Vydáno:	Cham : Springer Nature Switzerland : Imprint: Springer, 2025.
Vydání:	1st ed. 2025.
Edice:	Analog Circuits and Signal Processing,
Témata:	Electronic circuit design. Telecommunication. Wireless communication systems. Mobile communication systems. Electronics Design and Verification. Microwaves, RF Engineering and Optical Communications. Wireless and Mobile Communication.
On-line přístup:	https://doi.org/10.1007/978-3-031-85455-2
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