APA引文

Kuntman, H., Özenli, D., Kaçar, F., & Özçelep, Y. (2025). Reliability of CMOS Analog ICs (1st ed. 2025.). Springer Nature Switzerland : Imprint: Springer. https://doi.org/10.1007/978-3-031-85455-2

Chicago Style (17th ed.) Citation

Kuntman, Hakan, Deniz Özenli, Fırat Kaçar, and Yasin Özçelep. Reliability of CMOS Analog ICs. 1st ed. 2025. Cham: Springer Nature Switzerland : Imprint: Springer, 2025. https://doi.org/10.1007/978-3-031-85455-2.

MLA引文

Kuntman, Hakan, et al. Reliability of CMOS Analog ICs. 1st ed. 2025. Springer Nature Switzerland : Imprint: Springer, 2025. https://doi.org/10.1007/978-3-031-85455-2.