Reliability of CMOS Analog ICs
This book presents recent advances in reliability investigation of MOS transistors and their applications. Theory and experimental results are discussed, in order to demonstrate the efficacy of the techniques presented. Readers will be enabled to improve their designs in application areas of analog...
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| Main Authors: | , , , |
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| 企業作者: | |
| 格式: | 電子 電子書 |
| 語言: | 英语 |
| 出版: |
Cham :
Springer Nature Switzerland : Imprint: Springer,
2025.
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| 版: | 1st ed. 2025. |
| 叢編: | Analog Circuits and Signal Processing,
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| 主題: | |
| 在線閱讀: | https://doi.org/10.1007/978-3-031-85455-2 |
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| 總結: | This book presents recent advances in reliability investigation of MOS transistors and their applications. Theory and experimental results are discussed, in order to demonstrate the efficacy of the techniques presented. Readers will be enabled to improve their designs in application areas of analog signal processing, ranging from very low frequencies at several Hz levels of biomedical signals to RF applications operating at GHz level, from EEG signals to cognitive radio and encrypted communications or low-noise amplifiers in wireless communications. Presents recent advances in statistical method based reliability estimation of MOS transistors; Includes discussion of theory and experimental results, in order to demonstrate efficacy of techniques presented; Discusses design examples for specific application areas, enabling readers to follow recent advances and trends. |
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| 實物描述: | 1 online resource (XII, 94 p. 64 illus.). 13 illus. in color. |
| ISBN: | 9783031854552 |
| ISSN: | 2197-1854 |
| DOI: | 10.1007/978-3-031-85455-2 |