Reliability of CMOS Analog ICs
This book presents recent advances in reliability investigation of MOS transistors and their applications. Theory and experimental results are discussed, in order to demonstrate the efficacy of the techniques presented. Readers will be enabled to improve their designs in application areas of analog...
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| Váldodahkkit: | , , , |
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| Searvvušdahkki: | |
| Materiálatiipa: | Elektrovnnalaš E-girji |
| Giella: | eaŋgalasgiella |
| Almmustuhtton: |
Cham :
Springer Nature Switzerland : Imprint: Springer,
2025.
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| Preanttus: | 1st ed. 2025. |
| Ráidu: | Analog Circuits and Signal Processing,
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| Fáttát: | |
| Liŋkkat: | https://doi.org/10.1007/978-3-031-85455-2 |
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Sisdoallologahallan:
- Introduction
- The reliability model for PMOS and NMOS transistors based on statistical methods
- Demonstration of Proposed Method with Application Examples
- On the degradation of OTA-C–based CMOS low-power filter circuits for biomedical instrumentation
- Power MOSFET degradation and statistical investigation of the degradation effect on DC-DC converters and converter parameters.